发明授权
- 专利标题: Semiconductor memory device having replica circuit
- 专利标题(中): 具有复制电路的半导体存储器件
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申请号: US12430253申请日: 2009-04-27
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公开(公告)号: US07791971B2公开(公告)日: 2010-09-07
- 发明人: Akihito Tohata , Tomoaki Yabe
- 申请人: Akihito Tohata , Tomoaki Yabe
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Turocy & Watson, LLP
- 优先权: JP2006-281744 20061016
- 主分类号: G11C7/00
- IPC分类号: G11C7/00
摘要:
A semiconductor memory device includes first and second cell arrays which have memory cells arrayed in row and column directions, first and second bit lines which are connected to the memory cells arrayed in the column direction, and first and second sense amplifiers which are connected to the first, second bit lines, respectively. The device also includes first and second dummy cell arrays which have dummy cells arrayed in the row and column directions, a dummy word line which is connected to the dummy cells arrayed in the row direction, first and second dummy bit lines which are connected to the dummy cells arrayed in the column direction and receive an output from the dummy word line, and first and second sense amplifier activation circuits which activate the first, second sense amplifiers in accordance with first and second control signals output from the first and second dummy bit lines, respectively.
公开/授权文献
- US20090213635A1 SEMICONDUCTOR MEMORY DEVICE HAVING REPLICA CIRCUIT 公开/授权日:2009-08-27
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