发明授权
US07792251B2 Method for the correction of lag charge in a flat-panel X-ray detector
有权
在平板X射线检测器中校正滞后电荷的方法
- 专利标题: Method for the correction of lag charge in a flat-panel X-ray detector
- 专利标题(中): 在平板X射线检测器中校正滞后电荷的方法
-
申请号: US12055085申请日: 2008-06-03
-
公开(公告)号: US07792251B2公开(公告)日: 2010-09-07
- 发明人: Guillaume Bacher , Mylene Roussel , Benjamin Didier Rene Wimille , Mathieu Seval , Julien Georges Heyman
- 申请人: Guillaume Bacher , Mylene Roussel , Benjamin Didier Rene Wimille , Mathieu Seval , Julien Georges Heyman
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 代理机构: Global Patent Operation
- 优先权: FR0754068 20070327
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
A method for the correction of lag charges in a flat-panel X-ray detector makes it possible, for each integration phase of the detector, to determine an initial read phase situated just before said integration phase. The method of the invention enables the measurement, for each integration phase, of the charges present in the detector at the corresponding initial read phase, the production of a lag image from the latent charges measured in the initial read phase and the subtraction of the lag image from the raw image. The use of the measurement of charges enables the direct correction of the lag image in the acquisition without the use of a correction module as in the prior art.