发明授权
- 专利标题: Specific component measuring method by spectral measurement
- 专利标题(中): 通过光谱测量的特定成分测量方法
-
申请号: US10561538申请日: 2004-06-21
-
公开(公告)号: US07795034B2公开(公告)日: 2010-09-14
- 发明人: Takashi Fujita , Sachiko Yamamoto , Hiroyuki Yamada , Wataru Akahane
- 申请人: Takashi Fujita , Sachiko Yamamoto , Hiroyuki Yamada , Wataru Akahane
- 申请人地址: JP Osaka-shi
- 专利权人: Wako Pure Chemical Industries, Ltd.
- 当前专利权人: Wako Pure Chemical Industries, Ltd.
- 当前专利权人地址: JP Osaka-shi
- 代理机构: Westerman, Hattori, Daniels & Adrian, LLP
- 优先权: JP2003-270797 20030703; JP2004-106577 20040331
- 国际申请: PCT/JP2004/008711 WO 20040621
- 国际公布: WO2005/003744 WO 20050113
- 主分类号: G01N25/18
- IPC分类号: G01N25/18
摘要:
The present invention discloses a method for measuring an amount of an objective component to be measured in a sample, which comprises; preventing an electric charge in an atmosphere in a photometry chamber from transferring to the surface of a solution which generates light due to an energy variation of a substance induced by the objective component in the sample, measuring value of the light, and determining an amount of the objective component in the sample on the basis of the measured value thus obtained, and an instrument used for the method.According to the present invention, in measurement of an objective component in a sample using a spectrophotometer, problems such as between-day variation of signal values or increase of background value, etc. can be solved, and a trace component can be measured in high accuracy and high sensitivity.
公开/授权文献
信息查询