发明授权
US07801264B2 Method for calibrating a dual -spectral computed tomography (CT) system
有权
校准双光谱计算机断层摄影(CT)系统的方法
- 专利标题: Method for calibrating a dual -spectral computed tomography (CT) system
- 专利标题(中): 校准双光谱计算机断层摄影(CT)系统的方法
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申请号: US11959709申请日: 2007-12-19
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公开(公告)号: US07801264B2公开(公告)日: 2010-09-21
- 发明人: Xiaoye Wu , James Walter Leblanc , Paavana Sainath
- 申请人: Xiaoye Wu , James Walter Leblanc , Paavana Sainath
- 申请人地址: US NY Niskayuna
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Niskayuna
- 代理商 Jason K. Klindtworth
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
A method for calibrating and reconstructing material density images in a dual-spectral computed tomography (CT) system 100 is disclosed. An X-ray source in the CT system 100 emits a first X-ray spectrum and a second X-ray spectrum towards an object. The method includes computing calibration coefficients by using projection data from the object for the two X-ray spectra and by linearizing at least two basis materials such as bone and water simultaneously. Further, basis materials decomposition coefficients for the at least two basis materials are computed by linearizing the basis materials individually. Correction values for the projection data and for the basis materials are then computed by using the basis materials decomposition coefficients and the calibration coefficients. The computed correction values are used in reconstructing material density images for the basis materials.
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