发明授权
- 专利标题: Device and method for optometry
- 专利标题(中): 验光装置及方法
-
申请号: US12056617申请日: 2008-03-27
-
公开(公告)号: US07806529B2公开(公告)日: 2010-10-05
- 发明人: Toshifumi Mihashi , Yoko Hirohara , Mariko Kobayashi
- 申请人: Toshifumi Mihashi , Yoko Hirohara , Mariko Kobayashi
- 申请人地址: JP Tokyo
- 专利权人: Topcon Corporation
- 当前专利权人: Topcon Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Foley & Lardner LLP
- 优先权: JP2007-095058 20070330
- 主分类号: A61B3/02
- IPC分类号: A61B3/02 ; A61B3/10
摘要:
An eye examination apparatus 100 of the present invention comprises, a refractive power measuring section 50 for measuring refractive powers of subject eyes E of a subject in a binocular viewing state, an eye chart presenting section 30 for presenting a subjective measurement eye chart to be observed by the subject, a correcting section 40 for correcting the subject eyes by referring to data on the refractive powers measured with the refractive power measuring section 50 and using the subjective measurement eye chart presented in the eye chart presenting section 30 and an optical characteristics measuring section 10 for subjectively measuring an optical characteristic of the subject eyes E corrected or being corrected with the correcting section 40 in a state where the subject is binocularly viewing the subjective measurement eye chart.
公开/授权文献
- US20080246921A1 DEVICE AND METHOD FOR OPTOMETRY 公开/授权日:2008-10-09