Invention Grant
- Patent Title: Standard cell without OD space effect in Y-direction
- Patent Title (中): 标准电池在Y方向没有OD空间效应
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Application No.: US12345372Application Date: 2008-12-29
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Publication No.: US07808051B2Publication Date: 2010-10-05
- Inventor: Yung-Chin Hou , Lee-Chung Lu , Ta-Pen Guo , Li-Chun Tien , Ping Chung Li , Chun-Hui Tai , Shu-Min Chen
- Applicant: Yung-Chin Hou , Lee-Chung Lu , Ta-Pen Guo , Li-Chun Tien , Ping Chung Li , Chun-Hui Tai , Shu-Min Chen
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L29/76
- IPC: H01L29/76

Abstract:
An integrated circuit structure includes a semiconductor substrate; a first active region in the semiconductor substrate; and a second active region in the semiconductor substrate and of an opposite conductivity type than the first active region. A gate electrode strip is over the first and the second active regions and forms a first MOS device and a second MOS device with the first active region and the second active region, respectively. A first spacer bar is in the semiconductor substrate and connected to the first active region. At least a portion of the first spacer bar is adjacent to and spaced apart from a portion of the first active region. A second spacer bar is in the semiconductor substrate and connected to the second active region. At least a portion of the second spacer bar is adjacent to and spaced apart from a portion of the second active region.
Public/Granted literature
- US20100078725A1 Standard Cell without OD Space Effect in Y-Direction Public/Granted day:2010-04-01
Information query
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