发明授权
- 专利标题： Detector for detecting electromagnetic waves
- 专利标题（中）： 用于检测电磁波的检测器
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申请号： US11774087申请日： 2007-07-06
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公开(公告)号： US07816747B2公开(公告)日： 2010-10-19
- 发明人: Thomas E. Morf , Martin Leo Schmatz , Jonas R. Weiss
- 申请人： Thomas E. Morf , Martin Leo Schmatz , Jonas R. Weiss
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理商 David A. Cain
- 优先权： EP06116745 20060706
- 主分类号： H01L27/14
- IPC分类号： H01L27/14 ; H01L31/00
摘要：
A detector for detecting electromagnetic waves, the detector having an antenna for receiving the electromagnetic waves, a semiconductor element, wherein a termination section of the semiconductor element establishes a termination resistor of the antenna, wherein the termination section is provided for heating a temperature-sensitive part of the semiconductor element, wherein the semiconductor element comprises a temperature-dependent characteristic that is dependent from the temperature of the temperature sensitive part and a measurement unit for measuring the temperature-dependent characteristic of the semiconductor element.
公开/授权文献
- US20080251870A1 DETECTOR FOR DETECTING ELECTROMAGNETIC WAVES 公开/授权日：2008-10-16
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