发明授权
- 专利标题: Test techniques for a delay-locked loop receiver interface
- 专利标题(中): 延迟锁定环路接收机接口的测试技术
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申请号: US11756674申请日: 2007-06-01
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公开(公告)号: US07817761B2公开(公告)日: 2010-10-19
- 发明人: Meei-Ling Chiang , Dwight K. Elvey , Sanjeev Maheshwari , Emerson S. Fang
- 申请人: Meei-Ling Chiang , Dwight K. Elvey , Sanjeev Maheshwari , Emerson S. Fang
- 申请人地址: US CA Sunnyvale
- 专利权人: Advanced Micro Devices, Inc.
- 当前专利权人: Advanced Micro Devices, Inc.
- 当前专利权人地址: US CA Sunnyvale
- 代理机构: Zagorin O'Brien Graham LLP
- 主分类号: H04L7/00
- IPC分类号: H04L7/00 ; H03L7/06
摘要:
An integrated circuit includes a variable delay circuit configured to generate at least one delayed clock signal based on a first clock signal and a first control signal. The integrated circuit includes a control circuit configured to generate a count value based on a second input signal and a second control signal. The first clock signal is a first version of the at least one delayed clock signal. At least one of the second input signal and the second control signal is a second version of the at least one delayed clock signal and the count value is indicative of a frequency characteristic of the at least one delayed clock signal. The integrated circuit is configured to monotonically vary the first control signal over a range of values and the count value is determined for individual values of the control signal.
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