发明授权
US07821744B2 Thin film magnetic head substrate with lapping process monitors for read and write elements with common electrode for the read and write elements
有权
薄膜磁头基板，具有研磨过程监视器，用于读和写元件，具有用于读取和写入元件的公共电极
- 专利标题： Thin film magnetic head substrate with lapping process monitors for read and write elements with common electrode for the read and write elements
- 专利标题（中）： 薄膜磁头基板，具有研磨过程监视器，用于读和写元件，具有用于读取和写入元件的公共电极
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申请号： US11697979申请日： 2007-04-09
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公开(公告)号： US07821744B2公开(公告)日： 2010-10-26
- 发明人: Toru Takahashi , Kiyoshi Kobayashi
- 申请人： Toru Takahashi , Kiyoshi Kobayashi
- 申请人地址： JP Tokyo
- 专利权人： TDK Corporation
- 当前专利权人： TDK Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Brinks Hofer Gilson & Lione
- 优先权： JP2006-107397 20060410
- 主分类号： G11B5/29
- IPC分类号： G11B5/29 ; H04F31/00
摘要：
A thin film magnetic head substrate includes a plurality of head element portions having read elements and write elements in rows. Adjacent head element portions interpose a read monitor element and a write monitor element that are used as element resistance monitors for the read element and the write element when a lapping process is performed to form a medium-facing surface on the head element portion. A common electrode terminal is connected with the read monitor element and the write monitor element. A pair of individual electrode terminals are each connected to the read monitor element and the write monitor element, respectively.
公开/授权文献
- US20070247753A1 THIN FILM MAGNETIC HEAD SUBSTRATE WITH MONITOR ELEMENT 公开/授权日：2007-10-25
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