Invention Grant
- Patent Title: Depth gauge
- Patent Title (中): 深度计
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Application No.: US12501934Application Date: 2009-07-13
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Publication No.: US07823296B2Publication Date: 2010-11-02
- Inventor: Alberto A. Fernandez Dell'oca
- Applicant: Alberto A. Fernandez Dell'oca
- Applicant Address: US PA West Chester
- Assignee: Synthes USA, LLC
- Current Assignee: Synthes USA, LLC
- Current Assignee Address: US PA West Chester
- Agency: Fay Kaplun & Marcin, LLP
- Main IPC: A61B5/107
- IPC: A61B5/107

Abstract:
A depth gauge for measuring the depth of blind holes in bones and/or nails inserted into bones. The measurement tool comprises: a probe with an abutment at its end to engage against the distal edge of the blind hole; a tubular body; and a grooved insert. After the probe, lying into the tubular body, is positioned through the blind hole to be measured, the grooved insert is slid forward inside the tubular body, surrounding the probe, and pushing the probe sideward, towards the blind hole wall. When probe and groove insert are retracted together, they firmly engage against the distal bone wall. The tubular housing is then pushed forward until it abuts against the proximal bone wall, allowing even in small diameter holes, an accurate reading of hole depth on the scale located at the rear end of the probe.
Public/Granted literature
- US20090272001A1 Depth Gauge Public/Granted day:2009-11-05
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