Invention Grant
- Patent Title: Method of reducing an etch rate
- Patent Title (中): 降低蚀刻速率的方法
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Application No.: US11770195Application Date: 2007-06-28
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Publication No.: US07824562B2Publication Date: 2010-11-02
- Inventor: Kalman Pelhos
- Applicant: Kalman Pelhos
- Applicant Address: US CA Scotts Valley
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Scotts Valley
- Agency: Westman, Champlin & Kelly, P.A.
- Main IPC: B44C1/22
- IPC: B44C1/22

Abstract:
A method of fabricating a bit patterned storage medium includes obtaining a substrate having a magnetic layer and forming a mask over the magnetic layer. The magnetic layer is etched through the mask using a reactive ion etch. The etch rate of the mask is reduced by introducing a gas into the reactive ion etch.
Public/Granted literature
- US20090001047A1 METHOD FOR FABRICATING PATTERNED MAGNETIC RECORDING MEDIA Public/Granted day:2009-01-01
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