Invention Grant
- Patent Title: Deposition processes for titanium nitride barrier and aluminum
- Patent Title (中): 氮化钛屏障和铝的沉积工艺
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Application No.: US11864100Application Date: 2007-09-28
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Publication No.: US07824743B2Publication Date: 2010-11-02
- Inventor: Wei Ti Lee , Yen-Chih Wang , Mohd Fadzli Anwar Hassan , Ryeun Kwan Kim , Hyung Chul Park , Ted Guo , Alan A. Ritchie
- Applicant: Wei Ti Lee , Yen-Chih Wang , Mohd Fadzli Anwar Hassan , Ryeun Kwan Kim , Hyung Chul Park , Ted Guo , Alan A. Ritchie
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: B05D5/12
- IPC: B05D5/12 ; H01L21/04 ; H01L21/203 ; H05H1/24

Abstract:
Embodiments described herein provide a method for forming two titanium nitride materials by different PVD processes, such that a metallic titanium nitride layer is initially formed by a PVD process in a metallic mode and a titanium nitride retarding layer is formed over a portion of the metallic titanium nitride layer by a PVD process in a poison mode. Subsequently, a first aluminum layer, such as an aluminum seed layer, may be selectively deposited on exposed portions of the metallic titanium nitride layer by a CVD process. Thereafter, a second aluminum layer, such as an aluminum bulk layer, may be deposited on exposed portions of the first aluminum layer and the titanium nitride retarding layer during an aluminum PVD process.
Public/Granted literature
- US20090087585A1 DEPOSITION PROCESSES FOR TITANIUM NITRIDE BARRIER AND ALUMINUM Public/Granted day:2009-04-02
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