Invention Grant
- Patent Title: Method for examining WT1-related disease
- Patent Title (中): 检测WT1相关疾病的方法
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Application No.: US11037128Application Date: 2005-01-19
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Publication No.: US07824865B2Publication Date: 2010-11-02
- Inventor: Haruo Sugiyama
- Applicant: Haruo Sugiyama
- Agency: Sughrue Mion, PLLC
- Priority: JP2000-152923 20000524; JP2001-014927 20010123
- Main IPC: G01N33/53
- IPC: G01N33/53

Abstract:
The invention provides a method for testing a WT1-related disease, such as leukemia, a solid cancer, or an atypia, for diagnosing the disease, evaluating the course of cure and the prognosis of the disease more simply with high reliability, the method comprises measuring the amount of antibody against WT1 in a sample and using the measurement value and the time course of the value as a clinical marker for the testing.
Public/Granted literature
- US20050148037A1 Method for examining WT1-related disease Public/Granted day:2005-07-07
Information query
IPC分类: