Invention Grant
- Patent Title: Method and system for improved nickel silicide
- Patent Title (中): 改善硅化镍的方法和系统
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Application No.: US10959674Application Date: 2004-10-04
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Publication No.: US07825025B2Publication Date: 2010-11-02
- Inventor: Amitabh Jain , Peijun Chen , Jorge A. Kittl
- Applicant: Amitabh Jain , Peijun Chen , Jorge A. Kittl
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Jacqueline J. Garner; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L21/477

Abstract:
According to one embodiment of the invention, a method for nickel silicidation includes providing a substrate having a source region, a gate region, and a drain region, forming a source in the source region and a drain in the drain region, annealing the source and the drain, implanting, after the annealing the source and the drain, a heavy ion in the source region and the drain region, depositing a nickel layer in each of the source and drain regions, and heating the substrate to form a nickel silicide region in each of the source and drain regions by heating the substrate.
Public/Granted literature
- US20060073656A1 Method and system for improved nickel silicide Public/Granted day:2006-04-06
Information query
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