Invention Grant
- Patent Title: Method of fabricating a semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US11855809Application Date: 2007-09-14
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Publication No.: US07825031B2Publication Date: 2010-11-02
- Inventor: Dirk Manger , Rolf Weis , Christoph Noelscher
- Applicant: Dirk Manger , Rolf Weis , Christoph Noelscher
- Applicant Address: DE Munich
- Assignee: Qimonda AG
- Current Assignee: Qimonda AG
- Current Assignee Address: DE Munich
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
The invention relates to a method of fabricating an integrated circuit, including the steps of providing at least one layer; performing a first implantation step, wherein particles are implanted into the layer under a first direction of incidence; performing a second implantation step, wherein particles are implanted into the layer under a second direction of incidence which is different from the first direction of incidence; performing a removal step, wherein the layer is partially removed depending on the local implant dose generated by the first and the second implantation step.
Public/Granted literature
- US20090075462A1 Method of Fabricating a Semiconductor Device Public/Granted day:2009-03-19
Information query
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