Invention Grant
- Patent Title: Method of fabricating openings and contact holes
- Patent Title (中): 制造开口和接触孔的方法
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Application No.: US11163149Application Date: 2005-10-06
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Publication No.: US07825034B2Publication Date: 2010-11-02
- Inventor: Po-Chao Tsao , Chang-Chi Huang , Ming-Tsung Chen
- Applicant: Po-Chao Tsao , Chang-Chi Huang , Ming-Tsung Chen
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo; Min-Lee Teng
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
A substrate having an etch stop layer and at least a dielectric layer disposed from bottom to top is provided. The dielectric layer is then patterned to form a plurality of openings exposing the etch stop layer. A dielectric thin film is subsequently formed to cover the dielectric layer, the sidewalls of the openings, and the etch stop layer. The dielectric thin film disposed on the dielectric layer and the etch stop layer is then removed.
Public/Granted literature
- US20070082489A1 METHOD OF FABRICATING OPENINGS AND CONTACT HOLES Public/Granted day:2007-04-12
Information query
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