Invention Grant
- Patent Title: Method and system for calibrating a computed tomography system
- Patent Title (中): 用于校准计算机断层摄影系统的方法和系统
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Application No.: US11159706Application Date: 2005-06-23
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Publication No.: US07825370B2Publication Date: 2010-11-02
- Inventor: Abdelaziz Ikhlef , Yasuhiro Imai
- Applicant: Abdelaziz Ikhlef , Yasuhiro Imai
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Armstrong Teasdale LLP
- Main IPC: G12B13/00
- IPC: G12B13/00
Abstract:
Methods and systems for calibrating a Computed Tomography (CT) system are provided. The method includes selectively activating each of a plurality of elements of a detector in the CT system. The method further includes determining for each of the selectively activated elements, a crosstalk effect on elements adjacent to the activated elements, to calibrate the CT system.
Public/Granted literature
- US20060289765A1 Method and system for calibrating a computed tomography system Public/Granted day:2006-12-28
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