Invention Grant
- Patent Title: Tandem time-of-flight mass spectrometer
- Patent Title (中): 串联飞行时间质谱仪
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Application No.: US10546323Application Date: 2004-02-23
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Publication No.: US07825374B2Publication Date: 2010-11-02
- Inventor: Robert James Cotter , Benjamin D. Gardner , Robert D. English , Serguei A. Ilchenko
- Applicant: Robert James Cotter , Benjamin D. Gardner , Robert D. English , Serguei A. Ilchenko
- Applicant Address: US MD Baltimore
- Assignee: The Johns Hopkins University
- Current Assignee: The Johns Hopkins University
- Current Assignee Address: US MD Baltimore
- Agency: Pillsbury Winthrop Shaw Pittman, LLP
- International Application: PCT/US2004/005278 WO 20040223
- International Announcement: WO2004/077488 WO 20040910
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
A tandem mass spectrometer includes a linear time-of-flight mass analyzer and curved field reflectron mass analyzer. The curved-field reflectron mass analyzer is disposed at an end of the linear time-of-flight mass analyzer such that ions having a plurality of ion masses formed in the linear time-of-flight analyzer such that ions having a plurality of ion masses formed in the linear time-of-flight analyzer enter the curved-field reflectron mass analyzer. The tandem mass spectrometer also includes a mass selection gate disposed between the time-of-flight mass analyzer and the curved-field reflectron mass analyzer. The mass selection gate selects an ion mass from the plurality of ion masses. Furthermore, the tandem mass spectrometer also includes a dissociating component located in a path of the ions formed in the linear time-of-flight analyzer. The dissociating component causes dissociation of the ions into a plurality of ion fragments.
Public/Granted literature
- US20070034794A1 Tandem time-of-flight mass spectrometer Public/Granted day:2007-02-15
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