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US07825401B2 Strained layers within semiconductor buffer structures 有权
半导体缓冲结构内的应变层

Strained layers within semiconductor buffer structures
Abstract:
A semiconductor workpiece including a substrate, a relaxed buffer layer including a graded portion formed on the substrate, and at least one strained transitional layer within the graded portion of the relaxed buffer layer and method of manufacturing the same. The at least one strained transitional layer reduces an amount of workpiece bow due to differential coefficient of thermal expansion (CTE) contraction of the relaxed buffer layer relative to CTE contraction of the substrate.
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