Invention Grant
- Patent Title: Capacitance measuring apparatus for capacitor
- Patent Title (中): 电容电容测量装置
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Application No.: US12036271Application Date: 2008-02-24
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Publication No.: US07825670B2Publication Date: 2010-11-02
- Inventor: Jun Nie , Pei Tang
- Applicant: Jun Nie , Pei Tang
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Frank R. Niranjan
- Priority: CN200710202561 20071115
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A measuring apparatus for measuring capacitance of a capacitor includes a microprocessor, a control circuit coupled to the capacitor, and an Analog-to-Digital (A/D) converting circuit. The control circuit receives a control signal from the microprocessor, and outputs an analog voltage signal of the capacitor, and the control circuit charges/discharges the capacitor according to the control signal. The A/D converting circuit receives the analog voltage signal from the control circuit, and outputs a digital voltage signal. The microprocessor receives the digital voltage signal from the A/D converting circuit, and calculates capacitance of the capacitor according to the digital voltage signal and charge/discharge time.
Public/Granted literature
- US20090128165A1 CAPACITANCE MEASURING APPARATUS FOR CAPACITOR Public/Granted day:2009-05-21
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