Invention Grant
- Patent Title: Contactor and test method using contactor
- Patent Title (中): 接触器和使用接触器的测试方法
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Application No.: US11798188Application Date: 2007-05-10
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Publication No.: US07825676B2Publication Date: 2010-11-02
- Inventor: Daisuke Koizumi , Naohito Kohashi , Kazuhiro Tashiro , Takumi Kumatabara
- Applicant: Daisuke Koizumi , Naohito Kohashi , Kazuhiro Tashiro , Takumi Kumatabara
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Semiconductor Limited
- Current Assignee Address: JP Yokohama
- Agency: Fujitsu Patent Center
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A contact terminal formed of an electrically conductive material is arranged in each of a plurality of holed of a contactor substrate. An electrically conductive part is formed on an inner surface of each hole. The contact terminal has a first contact part that contacts a terminal of an electronic part and a second contact part that contacts the electrically conductive part in a middle portion. When the contact terminal bends by the first contact part being pressed, the second contact part contacts the electrically conductive part of the contactor substrate and an appropriate degree of contact pressure is obtained.
Public/Granted literature
- US20070252608A1 Contactor and test method using contactor Public/Granted day:2007-11-01
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