Invention Grant
US07825680B2 Componet supplied with an analog value 有权
组件提供模拟值

Componet supplied with an analog value
Abstract:
An apparatus comprises at least one component arranged to be supplied with at least one analog value. In order to enable a testing of the at least one component, the apparatus further comprises at least one comparator configured to compare at least one analog value, which corresponds to at least one analog value supplied to the at least one component, with at least one analog value read from the at least one component. The comparator is moreover configured to provide a result of the comparison.
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