Invention Grant
- Patent Title: Threshold personalization testmode
- Patent Title (中): 门槛个性化测试模式
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Application No.: US11733081Application Date: 2007-04-09
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Publication No.: US07825704B2Publication Date: 2010-11-02
- Inventor: David McClure
- Applicant: David McClure
- Applicant Address: US TX Carrollton
- Assignee: STMicroelectronics, Inc.
- Current Assignee: STMicroelectronics, Inc.
- Current Assignee Address: US TX Carrollton
- Agent Lisa K. Jorgenson; William J. Kubida
- Main IPC: H03M1/78
- IPC: H03M1/78

Abstract:
A threshold personalization circuit for a reset or supervisor chip includes personalization fuses, which shift a resistor divider to provide a variety of selectable voltage thresholds. The personalization fuses may provide hundreds of millivolts of adjustment. The threshold personalization circuit further includes trim fuses to fine tune the threshold to within a few millivolts of the target threshold voltage. The threshold personalization circuit includes a test mode to cycle through to a particular personalization trim, such that at prelaser testing the personalized value is found (the fuse blow for personalization is emulated) and then the trim fuse amount can be based on the actual final personalized voltage. This results in very accurate threshold voltages for all personalized values.
Public/Granted literature
- US20070236268A1 THRESHOLD PERSONALIZATION TESTMODE Public/Granted day:2007-10-11
Information query
IPC分类: