Invention Grant
- Patent Title: Method and apparatus for analog graphics sample clock frequency offset detection and verification
- Patent Title (中): 用于模拟图形采样时钟频偏检测和验证的方法和装置
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Application No.: US11355815Application Date: 2006-02-16
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Publication No.: US07825990B2Publication Date: 2010-11-02
- Inventor: Bing Ouyang , John Michael Hayden , Troy Lane Ethridge , Anuradha Sundararajan , Larry D. Dickinson
- Applicant: Bing Ouyang , John Michael Hayden , Troy Lane Ethridge , Anuradha Sundararajan , Larry D. Dickinson
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Charles A. Brill; Wade James Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H03M1/12
- IPC: H03M1/12

Abstract:
A method and apparatus for an analog-to-digital video signal converter. The converter is controlled by a clock with controllable frequency and phase for sampling an analog signal. A circuit corrects the clock frequency using a period of a columnar frame differences as a function of columnar location. The sampling clock frequency is changed by an amount dependent on the period of the columnar differences. A second measure of the difference between successive frames is computed for a sequence of clock phases. The frequency of the clock is verified using a characteristic of the second measure. The characteristic can be the ratio of the maximum to the minimum of the second measure over selected clock phases. Other characteristics can be used such as a difference of a maximum and a minimum measure.
Public/Granted literature
- US20060274194A1 Method and apparatus for analog graphics sample clock frequency offset detection and verification Public/Granted day:2006-12-07
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