Invention Grant
- Patent Title: Apparatus and method for optical inspection
- Patent Title (中): 光学检测仪器及方法
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Application No.: US11583892Application Date: 2006-10-20
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Publication No.: US07826047B2Publication Date: 2010-11-02
- Inventor: Yukihiro Shibata , Shunji Maeda
- Applicant: Yukihiro Shibata , Shunji Maeda
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2005-343215 20051129
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
The present invention provides a variety of optical functions so as to be applicable to various kinds of objects to be inspected. For each of the optical functions, the invention accumulates contrasts (brightness differences), etc. of defects to be detected (DOI) and false defects not to be detected (nuisance), and efficiently selects parameters advantageous for inspection with high sensitivity and low nuisance ratio. A wavelength band, an illumination scheme, and filtering parameters can be selected for an optical system.
Public/Granted literature
- US20070121106A1 Apparatus and method for optical inspection Public/Granted day:2007-05-31
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