Invention Grant
- Patent Title: Transient detection circuit
- Patent Title (中): 瞬态检测电路
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Application No.: US12107902Application Date: 2008-04-23
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Publication No.: US07826187B2Publication Date: 2010-11-02
- Inventor: Ming-Dou Ker , Cheng-Cheng Yen , Chi-Sheng Liao , Tung-Yang Chen
- Applicant: Ming-Dou Ker , Cheng-Cheng Yen , Chi-Sheng Liao , Tung-Yang Chen
- Applicant Address: TW Sinshih Township, Tainan County TW Hsinchu
- Assignee: Himax Technologies Limited,National Chiao-Tung University
- Current Assignee: Himax Technologies Limited,National Chiao-Tung University
- Current Assignee Address: TW Sinshih Township, Tainan County TW Hsinchu
- Agency: Thomas, Kayden, Horstemeyer & Risley
- Main IPC: H02H9/00
- IPC: H02H9/00

Abstract:
A transient detection circuit coupled between a first power line and a second power line and including a first control unit, a setting unit, and a voltage regulation unit. The first control unit generates a first control signal. The first control signal is at a first level when an electrostatic discharge (ESD) event occurs. The first control signal is at a second level when the ESD event does not occur. The setting unit sets a first node. The first node is set at the second level when the first control signal is at the first level. The voltage regulation unit regulates the first node. The voltage regulation unit regulates the level of the first node at the second level when the first control signal is at the second level.
Public/Granted literature
- US20090267584A1 TRANSIENT DETECTION CIRCUIT Public/Granted day:2009-10-29
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