Invention Grant
US07826255B2 Variable write and read methods for resistive random access memory
有权
电阻随机存取存储器的可变写和读方法
- Patent Title: Variable write and read methods for resistive random access memory
- Patent Title (中): 电阻随机存取存储器的可变写和读方法
-
Application No.: US12210526Application Date: 2008-09-15
-
Publication No.: US07826255B2Publication Date: 2010-11-02
- Inventor: Haiwen Xi , Hongyue Liu , Xiaobin Wang , Yong Lu , Yiran Chen , Yuankai Zheng , Dimitar V. Dimitrov , Dexin Wang , Hai Li
- Applicant: Haiwen Xi , Hongyue Liu , Xiaobin Wang , Yong Lu , Yiran Chen , Yuankai Zheng , Dimitar V. Dimitrov , Dexin Wang , Hai Li
- Applicant Address: US CA Scotts Valley
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Scotts Valley
- Agency: Campbell Nelson Whipps LLC
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/14

Abstract:
Variable write and read methods for resistance random access memory (RRAM) are disclosed. The methods include initializing a write sequence and verifying the resistance state of the RRAM cell. If a write pulse is needed, then two or more write pulses are applied through the RRAM cell to write the desired data state to the RRAM cell. Each subsequent write pulse has substantially the same or greater write pulse duration. Subsequent write pulses are applied to the RRAM cell until the RRAM cell is in the desired data state or until a predetermined number of write pulses have been applied to the RRAM cell. A read method is also disclosed where subsequent read pulses are applied through the RRAM cell until the read is successful or until a predetermined number of read pulses have been applied to the RRAM cell.
Public/Granted literature
- US20100067281A1 VARIABLE WRITE AND READ METHODS FOR RESISTIVE RANDOM ACCESS MEMORY Public/Granted day:2010-03-18
Information query