Invention Grant
- Patent Title: Memory device with variable trim setting
- Patent Title (中): 具有可变调节设置的存储设备
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Application No.: US12327667Application Date: 2008-12-03
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Publication No.: US07826265B2Publication Date: 2010-11-02
- Inventor: Seiichi Aritome
- Applicant: Seiichi Aritome
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
A memory device includes a memory array including a plurality of cells. The cells are divided into a plurality of subsets. Each subset has at least one associated trim parameter. The trim parameter for each subset is stored in the memory array within the associated subset. Circuitry is operable to program at least a portion of a selected subset using the associated trim parameter. A method for operating a memory device includes storing at least one trim parameter for each of a plurality of subsets of a memory array in the memory device within each of the subsets. At least a portion of a selected subset is programmed based on the at least one trim parameter associated with the selected subset.
Public/Granted literature
- US20090109756A1 MEMORY DEVICE WITH VARIABLE TRIM SETTING Public/Granted day:2009-04-30
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