Invention Grant
US07826295B2 Semiconductor memory device including a repair circuit which includes mode fuses
有权
半导体存储器件包括包括模式保险丝的修复电路
- Patent Title: Semiconductor memory device including a repair circuit which includes mode fuses
- Patent Title (中): 半导体存储器件包括包括模式保险丝的修复电路
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Application No.: US12076063Application Date: 2008-03-13
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Publication No.: US07826295B2Publication Date: 2010-11-02
- Inventor: Atsushi Masumizu , Sadayuki Okuma
- Applicant: Atsushi Masumizu , Sadayuki Okuma
- Applicant Address: JP Chuo-ku, Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Chuo-ku, Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2007-066084 20070315
- Main IPC: G11C17/18
- IPC: G11C17/18
Abstract:
In a semiconductor memory device, a repair circuit includes mode fuses to select one of plural repair modes corresponding to plural kinds of defects, respectively. The semiconductor memory device can repair a defective memory cell having operational margin defect without using redundancy memory cells.
Public/Granted literature
- US20080225620A1 Semiconductor memory device Public/Granted day:2008-09-18
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