Invention Grant
US07826305B2 Latency counter, semiconductor memory device including the same, and data processing system
有权
延迟计数器,包括其的半导体存储器件和数据处理系统
- Patent Title: Latency counter, semiconductor memory device including the same, and data processing system
- Patent Title (中): 延迟计数器,包括其的半导体存储器件和数据处理系统
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Application No.: US12216675Application Date: 2008-07-09
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Publication No.: US07826305B2Publication Date: 2010-11-02
- Inventor: Hiroki Fujisawa
- Applicant: Hiroki Fujisawa
- Applicant Address: JP Chuo-ku, Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Chuo-ku, Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2007-181357 20070710
- Main IPC: G11C8/00
- IPC: G11C8/00

Abstract:
A latency counter includes: a frequency-dividing circuit that generates a plurality of divided clocks LCLKE and LCLKO of which the phases differ each other based on an internal clock LCLK; and frequency-divided counter circuits each of which counts a latency of an internal command based on the corresponding divided clocks LCLKE and LCLKO. Thus, the counting of the latency is performed based not on the internal clock LCLK itself but on the divided clocks LCLKE and LCLKO obtained by frequency-dividing the internal clock LCLK. Thus, even when a frequency of the internal clock LCLK is high, an operation margin can be sufficiently secured.
Public/Granted literature
- US20090016146A1 Latency counter, semiconductor memory device including the same, and data processing system Public/Granted day:2009-01-15
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