Invention Grant
- Patent Title: All-to-all sequenced fault detection system
- Patent Title (中): 一对一的顺序故障检测系统
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Application No.: US11052658Application Date: 2005-02-07
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Publication No.: US07826379B2Publication Date: 2010-11-02
- Inventor: Charles Jens Archer , Kurt Walter Pinnow , Joseph D. Ratterman , Brian Edward Smith
- Applicant: Charles Jens Archer , Kurt Walter Pinnow , Joseph D. Ratterman , Brian Edward Smith
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Wood, Herron & Evans, LLP
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G06F11/00 ; G06F15/173 ; G08C15/00 ; H04J1/16 ; H04J3/14 ; H04L1/00 ; H04L12/26
Abstract:
An apparatus, program product and method enable nodal fault detection by sequencing communications between all system nodes. A master node may coordinate communications between two slave nodes before sequencing to and initiating communications between a new pair of slave nodes. The communications may be analyzed to determine the nodal fault.
Public/Granted literature
- US20060176826A1 All-to-all sequenced fault detection system Public/Granted day:2006-08-10
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