Invention Grant
- Patent Title: Phase locked loops capable of burn-in testing with increased locking range and burn-in testing method thereof
- Patent Title (中): 锁相环能够通过增加锁定范围和老化测试方法进行老化测试
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Application No.: US11822216Application Date: 2007-07-03
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Publication No.: US07826584B2Publication Date: 2010-11-02
- Inventor: Soo-Jin Paek , Jae-wook Lee , Ho-keun Cho
- Applicant: Soo-Jin Paek , Jae-wook Lee , Ho-keun Cho
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2006-0113036 20061115
- Main IPC: H03D3/24
- IPC: H03D3/24 ; H03L7/06

Abstract:
In phase locked loop, a phase detector detects a phase difference between a first clock signal and a second clock signal and output a first output signal based on the detected difference. A charge pump generates a control voltage in response to the first output signal from the phase detector. A voltage-controlled oscillator generates the second clock signal. A controller controls the control voltage such that the phase difference between the first clock signal and the second clock signal is increased in response to a burn-in test mode signal.
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