Invention Grant
- Patent Title: Micro-focus field emission x-ray sources and related methods
- Patent Title (中): 微焦场发射X射线源及相关方法
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Application No.: US11717590Application Date: 2007-03-13
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Publication No.: US07826595B2Publication Date: 2010-11-02
- Inventor: Zejian Liu , Otto Z. Zhou , Jianping Lu
- Applicant: Zejian Liu , Otto Z. Zhou , Jianping Lu
- Applicant Address: US NC Chapel Hill
- Assignee: The University of North Carolina
- Current Assignee: The University of North Carolina
- Current Assignee Address: US NC Chapel Hill
- Agency: Jenkins, Wilson, Taylor & Hunt, P.A.
- Main IPC: H01J23/04
- IPC: H01J23/04

Abstract:
Micro-focus field emission x-ray sources and related methods are provided. A micro-focus field emission x-ray source can include a field emission cathode including a film with a layer of electron field emitting materials patterned on a conducting surface. Further, the x-ray source can include a gate electrode for extracting field emitted electrons from the cathode when a bias electrical field is applied between the gate electrode and the cathode. The x-ray source can also include an anode. Further, the x-ray source can include an electrostatic focusing unit between the gate electrode and anode. The electrostatic focusing unit can include multiple focusing electrodes that are electrically separated from each other. Each of the electrodes can have an independently adjustable electrical potential. A controller can be configured to adjust at least one of the electrical potentials of the focusing electrodes and to adjust a size of the cathode.
Public/Granted literature
- US20080043920A1 Micro-focus field emission x-ray sources and related methods Public/Granted day:2008-02-21
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