Invention Grant
US07826651B2 Method for operating an x-ray diagnostic apparatus for determining quality values
有权
用于操作用于确定质量值的x射线诊断装置的方法
- Patent Title: Method for operating an x-ray diagnostic apparatus for determining quality values
- Patent Title (中): 用于操作用于确定质量值的x射线诊断装置的方法
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Application No.: US12401295Application Date: 2009-03-10
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Publication No.: US07826651B2Publication Date: 2010-11-02
- Inventor: Stefan Böhm , Peter Durlak , Volker Heer , Martin Kolarjk
- Applicant: Stefan Böhm , Peter Durlak , Volker Heer , Martin Kolarjk
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Priority: DE102004060127 20041213
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method for checking an x-ray diagnostic apparatus is provided. Fluoroscopic series of x-ray images of a technical phantom are digitally acquired and stored. Difference between a dynamic image and a background image is calculated. A measuring field is predicted. Priori information about the shape of a clinically relevant object is determined. Hough transformation on a gray value image corresponding to the difference is applied. Contrast of the object from the Hough-transformed gray value image is determined. A square of the determined contrast is calculated. A noise variance is calculated by determining a sum of a noise variance of a homogenous image region and a variance of the background image. A contrast-to-noise ratio of the determined contrast and the calculated noise variance is determined. A square of the contrast-to-noise ratio is dynamically averaged. A Clinical Relevant Fluoroscopy Performance index for the x-ray diagnostic apparatus is determined.
Public/Granted literature
- US20090169088A1 METHOD FOR OPERATING AN X-RAY DIAGNOSTIC APPARATUS FOR DETERMINING QUALITY VALUES Public/Granted day:2009-07-02
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