Invention Grant
- Patent Title: System and method for measuring the temperature of a device
- Patent Title (中): 用于测量设备温度的系统和方法
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Application No.: US11274645Application Date: 2005-11-15
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Publication No.: US07826998B1Publication Date: 2010-11-02
- Inventor: Babak Taheri , Gopal Patil , Sanjeev Maheshwari
- Applicant: Babak Taheri , Gopal Patil , Sanjeev Maheshwari
- Applicant Address: US CA San Jose
- Assignee: Cypress Semiconductor Corporation
- Current Assignee: Cypress Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: G01K7/00
- IPC: G01K7/00
Abstract:
A method of measuring the temperature of device under test includes the steps of injecting a first current into an on-chip diode wherein a die containing the on-chip diode is under test. A second current is injected into the on-chip diode. A junction temperature is calculated based on the first current and the second current.
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