Invention Grant
- Patent Title: Straightness measuring method and straightness measuring apparatus
- Patent Title (中): 直线度测量方法和平直度测量仪器
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Application No.: US12607540Application Date: 2009-10-28
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Publication No.: US07827003B2Publication Date: 2010-11-02
- Inventor: Yoshihisa Kiyota , Kouichi Ichihara
- Applicant: Yoshihisa Kiyota , Kouichi Ichihara
- Applicant Address: JP Tokyo
- Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Squire, Sanders & Dempsey L.L.P.
- Priority: JP2008-277596 20081029
- Main IPC: G06F15/00
- IPC: G06F15/00 ; G01B5/20

Abstract:
Distances from three displacement meters arranged in a first direction to three measuring points arranged along a measurement line that extends in the first direction on a surface of an object to be measured are measured while a movable body, which is either the three displacement meter or an object to be measured, is moved in the first direction relative to a stationary body, which is the other one. Solution candidates are determined which are defined by two profiles among a surface profile along the measurement line, a profile of locus curve which is the locus a reference point fixed to the movable body, and a profile of a pitching component accompanied with the movement of the movable body. One candidate solution with the highest fitness is extracted by applying a genetic algorithm using a fitness function defined on the basis of the other profile.
Public/Granted literature
- US20100106455A1 STRAIGHTNESS MEASURING METHOD AND STRAIGHTNESS MEASURING APPARATUS Public/Granted day:2010-04-29
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