Invention Grant
- Patent Title: Checking of the skew constancy of a bit flow
- Patent Title (中): 检查位流的偏斜常数
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Application No.: US11166564Application Date: 2005-06-24
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Publication No.: US07827222B2Publication Date: 2010-11-02
- Inventor: Pierre-Yvan Liardet , Yannick Teglia
- Applicant: Pierre-Yvan Liardet , Yannick Teglia
- Applicant Address: FR Montrouge
- Assignee: STMicroelectronics S.A.
- Current Assignee: STMicroelectronics S.A.
- Current Assignee Address: FR Montrouge
- Agency: Wolf, Greenfield & Sacks, P.C.
- Agent Lisa K. Jorgenson; William R. McClellan
- Priority: FR0451324 20040624; FR0451325 20040624
- Main IPC: G06F7/58
- IPC: G06F7/58 ; G06F7/00
Abstract:
A method and a circuit for detecting a loss in the equiprobable character of a first output bit flow originating from at least one first element of normalization of an initial bit flow, including analyzing the flow rate of the normalization element.
Public/Granted literature
- US20050288924A1 Checking of the skew constancy of a bit flow Public/Granted day:2005-12-29
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