Invention Grant
- Patent Title: Central processing unit measurement facility
- Patent Title (中): 中央处理单元测量设备
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Application No.: US12244300Application Date: 2008-10-02
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Publication No.: US07827321B2Publication Date: 2010-11-02
- Inventor: Jane H. Bartik , Lisa Cranton Heller , Damian L. Osisek , Donald W. Schmidt , Patrick M. West, Jr. , Phil C. Yeh
- Applicant: Jane H. Bartik , Lisa Cranton Heller , Damian L. Osisek , Donald W. Schmidt , Patrick M. West, Jr. , Phil C. Yeh
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Heslin, Rothenberg, Farley & Mesiti P.C.
- Agent John E. Campbell; Blanche E. Schiller, Esq.
- Main IPC: G06F13/00
- IPC: G06F13/00 ; G06F3/00

Abstract:
A measurement sampling facility takes snapshots of the central processing unit (CPU) on which it is executing at specified sampling intervals to collect data relating to tasks executing on the CPU. The collected data is stored in a buffer, and at selected times, an interrupt is provided to remove data from the buffer to enable reuse thereof. The interrupt is not taken after each sample, but in sufficient time to remove the data and minimize data loss.
Public/Granted literature
- US20100088444A1 CENTRAL PROCESSING UNIT MEASUREMENT FACILITY Public/Granted day:2010-04-08
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