Invention Grant
- Patent Title: Defect detection and handling for memory based on pilot cells
- Patent Title (中): 基于导频小区的存储器的缺陷检测和处理
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Application No.: US12052350Application Date: 2008-03-20
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Publication No.: US07827450B1Publication Date: 2010-11-02
- Inventor: Xueshi Yang , Zining Wu
- Applicant: Xueshi Yang , Zining Wu
- Applicant Address: BM Hamilton
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G11C29/00

Abstract:
A memory system includes a first parameter estimation module that receives pilot signals that are generated based on pilot data stored in a memory. The first parameter estimate module generates a first estimate of a signal quality value associated with a block of the memory based on reference pilot information. A second parameter estimation module generates a second estimate of the signal quality value based on the first estimate and user data signals that are generated based on user data stored in the memory. A processing module generates recovered user data based on the second estimate.
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