Invention Grant
US07827450B1 Defect detection and handling for memory based on pilot cells 有权
基于导频小区的存储器的缺陷检测和处理

Defect detection and handling for memory based on pilot cells
Abstract:
A memory system includes a first parameter estimation module that receives pilot signals that are generated based on pilot data stored in a memory. The first parameter estimate module generates a first estimate of a signal quality value associated with a block of the memory based on reference pilot information. A second parameter estimation module generates a second estimate of the signal quality value based on the first estimate and user data signals that are generated based on user data stored in the memory. A processing module generates recovered user data based on the second estimate.
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