发明授权
- 专利标题： Burn-in test socket having cover with floatable pusher
- 专利标题（中）： 老化测试插座，带有可浮动推杆的盖子
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申请号： US12288513申请日： 2008-10-21
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公开(公告)号： US07828576B2公开(公告)日： 2010-11-09
- 发明人: Wei-Chih Lin , Hsiu-Yuan Hsu , Wen-Yi Hsieh
- 申请人： Wei-Chih Lin , Hsiu-Yuan Hsu , Wen-Yi Hsieh
- 申请人地址： TW Taipei Hsien
- 专利权人： Hon Hai Precision Ind. Co., Ltd.
- 当前专利权人： Hon Hai Precision Ind. Co., Ltd.
- 当前专利权人地址： TW Taipei Hsien
- 代理商 Andrew C. Cheng; Wei Te Chung; Ming Chieh Chang
- 优先权： TW96217633 20071022
- 主分类号： H01R13/62
- IPC分类号： H01R13/62
摘要：
A test socket comprising an insulative base with a plurality of contacts received in the base and a cover pivotally mounted to one end of the base. The cover comprises a pusher with an opening extending therethrough and a lid aligned with the pusher. The lid has a through hole corresponding to the opening of the pusher. Between the pusher and the lid have a plurality of elastic members for making the lid moveably with respect to the pusher.
公开/授权文献
- US20090104807A1 Burn-in test socket having cover with floatable pusher 公开/授权日：2009-04-23
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