发明授权
- 专利标题: Method for fabricating highly reflective ohmic contact in light-emitting devices
- 专利标题(中): 在发光器件中制造高反射欧姆接触的方法
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申请号: US12093512申请日: 2008-03-26
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公开(公告)号: US07829359B2公开(公告)日: 2010-11-09
- 发明人: Yingwen Tang , Li Wang , Fengyi Jiang
- 申请人: Yingwen Tang , Li Wang , Fengyi Jiang
- 申请人地址: CN Nanchang
- 专利权人: Lattice Power (Jiangxi) Corporation
- 当前专利权人: Lattice Power (Jiangxi) Corporation
- 当前专利权人地址: CN Nanchang
- 代理机构: Park, Vaughan, Fleming & Dowler LLP
- 国际申请: PCT/CN2008/000598 WO 20080326
- 国际公布: WO2009/117850 WO 20091001
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
One embodiment of the present invention provides a method for fabricating a highly reflective electrode in a light-emitting device. During the fabrication process, a multilayer semiconductor structure is fabricated on a growth substrate, wherein the multilayer semiconductor structure includes a first doped semiconductor layer, a second doped semiconductor layer, and/or a multi-quantum-wells (MQW) active layer. The method further includes the followings operations: forming a contact-assist metal layer on the first doped semiconductor layer, annealing the multilayer structure to activate the first doped semiconductor layer, removing the contact-assist metal layer, forming a reflective ohmic-contact metal layer on the first doped semiconductor layer, forming a bonding layer coupled to the reflective ohmic-contact metal layer, bonding the multilayer structure to a conductive substrate, removing the growth substrate, forming a first electrode coupled to the conductive substrate, and forming a second electrode on the second doped semiconductor layer.
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