发明授权
- 专利标题: Compensating for variations in memory cell programmed state distributions
- 专利标题(中): 补偿存储单元编程状态分布的变化
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申请号: US12428002申请日: 2009-04-22
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公开(公告)号: US07830708B1公开(公告)日: 2010-11-09
- 发明人: Chulmin Jung , Yong Lu , Harry Hongyue Liu
- 申请人: Chulmin Jung , Yong Lu , Harry Hongyue Liu
- 申请人地址: US CA Scotts Valley
- 专利权人: Seagate Technology LLC
- 当前专利权人: Seagate Technology LLC
- 当前专利权人地址: US CA Scotts Valley
- 代理机构: Fellers, Snider et al.
- 主分类号: G11C16/00
- IPC分类号: G11C16/00
摘要:
Method and apparatus for compensating for variations in memory cell programmed state distributions, such as but not limited to a non-volatile memory formed of NAND configured Flash memory cells. In accordance with various embodiments, a memory block is formed from a plurality of memory cells that are arranged into rows and columns within the memory block, each memory cell configured to have a programmed state. A selected row of the memory block is read by concurrently applying a stepped sequence of threshold voltages to each memory cell along the selected row while sequentially decoupling read current from groups of memory cells along the selected row as the programmed states of said groups of cells are successively determined.
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