发明授权
- 专利标题： Self-aligning nanowires and methods thereof
- 专利标题（中）： 自对准纳米线及其方法
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申请号： US11281192申请日： 2005-11-16
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公开(公告)号： US07833616B2公开(公告)日： 2010-11-16
- 发明人: Yoocharn Jeon , Alfred I-Tsung Pan , Hou T. Ng , Scott Haubrich
- 申请人： Yoocharn Jeon , Alfred I-Tsung Pan , Hou T. Ng , Scott Haubrich
- 申请人地址： US TX Houston
- 专利权人： Hewlett-Packard Development Company, L.P.
- 当前专利权人： Hewlett-Packard Development Company, L.P.
- 当前专利权人地址： US TX Houston
- 主分类号： H01L27/14
- IPC分类号： H01L27/14
摘要：
A self-aligning nanowire includes a nanowire portion and an aligning member attached to the nanowire portion. The aligning member interacts with another aligning member on an adjacent self-aligning nanowire to align the nanowires together. A method of aligning nanowires includes providing a plurality of the self-aligning nanowires, suspending the plurality in a carrier solution, and depositing the suspended plurality on a substrate. An ink formulation includes the plurality of suspended self-aligning nanowires in the carrier solution. A method of producing the self-aligning nanowire includes providing and associating the nanowire portion and the aligning member such that the nanowire produced is self-aligning with another nanowire.
公开/授权文献
- US20070111503A1 Self-aligning nanowires and methods thereof 公开/授权日：2007-05-17
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