发明授权
- 专利标题: Semiconductor device for detecting a phase of a clock
- 专利标题(中): 用于检测时钟相位的半导体器件
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申请号: US12327112申请日: 2008-12-03
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公开(公告)号: US07834664B2公开(公告)日: 2010-11-16
- 发明人: Sang-Sic Yoon , Kyung-Hoon Kim
- 申请人: Sang-Sic Yoon , Kyung-Hoon Kim
- 申请人地址: KR Gyeonggi-do
- 专利权人: Hynis Semiconductor Inc.
- 当前专利权人: Hynis Semiconductor Inc.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: IP & T Group LLP
- 优先权: KR10-2008-0067176 20080710
- 主分类号: G01R25/00
- IPC分类号: G01R25/00 ; H03D13/00
摘要:
A semiconductor, which includes a first phase detecting unit configured to detect a phase of a second clock on the basis of a phase of a first clock, and generate a first detection signal corresponding to a result of the detection, a second phase detecting unit configured to detect a phase of a delayed clock, which is generated by delaying the second clock by a predetermined time, on the basis of the phase of the first clock, and generate a second detection signal corresponding to a result of the detection, and a logic level determining unit configured to determine a logic level of a feedback output signal according to the first detection signal, the second detection signal and the feedback output signal.
公开/授权文献
- US20100007372A1 SEMICONDUCTOR DEVICE 公开/授权日:2010-01-14
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