发明授权
- 专利标题: Position measuring arrangement
- 专利标题(中): 位置测量装置
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申请号: US12284127申请日: 2008-09-18
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公开(公告)号: US07835014B2公开(公告)日: 2010-11-16
- 发明人: Elmar Mayer , Johann Oberhauser
- 申请人: Elmar Mayer , Johann Oberhauser
- 申请人地址: DE Traunreut
- 专利权人: Dr. Johannes Heidenhain GmbH
- 当前专利权人: Dr. Johannes Heidenhain GmbH
- 当前专利权人地址: DE Traunreut
- 代理机构: Brinks Hofer Gilson & Lione
- 优先权: DE102007045362 20070922
- 主分类号: G01B11/14
- IPC分类号: G01B11/14 ; G01D5/34
摘要:
A method for absolute position measuring that includes scanning a code having code elements arranged one behind the other in a measuring direction, wherein the code elements include sequential first and second code elements which define a code word containing absolute position information. The method including generating scanning signals within the first code elements and the second code elements. The method further including forming information regarding the sequential first and second code elements from the scanning signals via a reference value and determining the reference value as a function of at least one of the scanning signals within the first code elements and the scanning signals within the second code elements.
公开/授权文献
- US20090079996A1 Position measuring arrangement 公开/授权日:2009-03-26
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