Invention Grant
- Patent Title: Service and diagnostic logic scan apparatus and method
- Patent Title (中): 服务和诊断逻辑扫描装置和方法
-
Application No.: US11873852Application Date: 2007-10-17
-
Publication No.: US07836347B2Publication Date: 2010-11-16
- Inventor: Daniel H. Miller , Ferrell Mercer , Judy Popelas
- Applicant: Daniel H. Miller , Ferrell Mercer , Judy Popelas
- Applicant Address: US VA Charlottesville
- Assignee: GE Intelligent Platforms Inc.
- Current Assignee: GE Intelligent Platforms Inc.
- Current Assignee Address: US VA Charlottesville
- Agency: Global Patent Operation
- Agent Mark A. Conklin
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A diagnostic and service logic program for a programmable logic controller (PLC) is provided in parallel with the main machine logic program. The diagnostic and service logic program has the same functionality as the main machine logic program, but can be modified and operated independently of the main machine logic program for testing and debugging a faulty main machine logic program. The PLC can be switched between programs for testing and debugging.
Public/Granted literature
- US20090106590A1 SERVICE AND DIAGNOSTIC LOGIC SCAN APPARATUS AND METHOD Public/Granted day:2009-04-23
Information query
