Invention Grant
- Patent Title: Nonvolatile semiconductor memory and data reading method
- Patent Title (中): 非易失性半导体存储器和数据读取方法
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Application No.: US11863915Application Date: 2007-09-28
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Publication No.: US07843724B2Publication Date: 2010-11-30
- Inventor: Hitoshi Shiga , Susumu Fujimura , Yoshihiko Shindo
- Applicant: Hitoshi Shiga , Susumu Fujimura , Yoshihiko Shindo
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2006-265744 20060928
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A nonvolatile semiconductor memory that includes a memory cell array including a plurality of electrically writable memory cells; a plurality of word lines and a plurality of bit lines connected to the plurality of memory cells; and a data reading and programming control section. The data reading and programming cortrol section includes: an adjacent memory cell data reading section; an adjacent memory cell data memory section; a reading voltage level control section; a data reading section for reading the data from a first memory cell at a plurality of reading voltages corresponding to a plurality of predetermined reading voltage verify levels controlled using the reading voltage level control section; and a data determining section for deterraining which data of 4-value data is programmed in the first memory cell based on the data which is read by the data reading section.
Public/Granted literature
- US20080239805A1 NONVOLATILE SEMICONDUCTOR MEMORY AND DATA READING METHOD Public/Granted day:2008-10-02
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