发明授权
US07845214B2 Device and method for optical nanoindentation measurement 有权
光学纳米压痕测量的装置和方法

Device and method for optical nanoindentation measurement
摘要:
This invention relates to a device and method for optical nanoindentation measurement, according to which respective measurement results are obtained by having an indenter tip apply load to a fixed portion of a thin film, having an indenter tip apply load to a non-fixed portion of a thin film, and having a vibrating component transmit the dynamic properties of the vibration to the thin film. By combining the above measurement results in calculations, the Young's modulus, the Poisson's ratio, and the density of the thin film can be obtained.
公开/授权文献
信息查询
0/0