发明授权
- 专利标题: Protection device with lockout test
- 专利标题(中): 保护装置具有锁定测试
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申请号: US12235380申请日: 2008-09-22
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公开(公告)号: US07852607B2公开(公告)日: 2010-12-14
- 发明人: Dejan Radosavljevic , Thomas N. Packard , Bruce F. Macbeth
- 申请人: Dejan Radosavljevic , Thomas N. Packard , Bruce F. Macbeth
- 申请人地址: US NY Syracuse
- 专利权人: Pass & Seymour, Inc.
- 当前专利权人: Pass & Seymour, Inc.
- 当前专利权人地址: US NY Syracuse
- 代理机构: Bond, Schoeneck & King, PLLC
- 代理商 Daniel P. Malley
- 主分类号: H02H3/00
- IPC分类号: H02H3/00 ; H02H9/08
摘要:
The present invention is directed to a protective device that includes a detection circuit, a fault detection circuit, and a circuit interrupter assembly contacts configured to be driven into a tripped state in response to the trip actuation and driven into a reset state in response to a reset actuation. A reset mechanism is configured to provide the reset actuation in response to a user reset input. A test assembly includes a test circuit configured to generate a simulated electrical perturbation exceeding the predetermined level in response to a user test input and a test timing mechanism configured to drive the circuit interrupter into the tripped state and disable the reset mechanism if any one of the detection circuit, fault detection circuit, actuation assembly, or circuit interrupter assembly fail before a predetermined time elapses such that the device is permanently inoperable.
公开/授权文献
- US20090284880A1 Protection Device with Lockout Test 公开/授权日:2009-11-19
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