Invention Grant
US07859664B2 Plurality of samples and method for selecting a target sample therefrom
有权
多种样品和从其中选择目标样品的方法
- Patent Title: Plurality of samples and method for selecting a target sample therefrom
- Patent Title (中): 多种样品和从其中选择目标样品的方法
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Application No.: US12209260Application Date: 2008-09-12
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Publication No.: US07859664B2Publication Date: 2010-12-28
- Inventor: Peter Oma , Deepak Kumar Sharma
- Applicant: Peter Oma , Deepak Kumar Sharma
- Applicant Address: CA Ottawa
- Assignee: Brightwell Technologies Inc.
- Current Assignee: Brightwell Technologies Inc.
- Current Assignee Address: CA Ottawa
- Agency: Teitelbaum & MacLean
- Agent Neil Teitelbaum; Doug MacLean
- Main IPC: G01N15/02
- IPC: G01N15/02

Abstract:
The present invention provides a plurality of samples, each of which includes particles of a predetermined particle dimension, within narrow predetermined limits, dispersed in a carrier at a predetermined particle concentration. The predetermined particle dimension and the predetermined particle concentration are the same for each sample. However, advantageously, each sample has a different predetermined ratio of a value of an optical property of the particles to a value of the same optical property of the carrier. The present invention also provides a method for selecting a target sample from the plurality of samples to assess the measurement accuracy or the detection sensitivity of an optical particle analyzer as the predetermined ratio approaches 1.
Public/Granted literature
- US20090073437A1 PLURALITY OF SAMPLES AND METHOD FOR SELECTING A TARGET SAMPLE THEREFROM Public/Granted day:2009-03-19
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